FTG-12
Abstract: INCOMING RAW MATERIAL FILM INSPECTION procedure ADE-6 Sample form for INCOMING Inspection of RAW MATERIAL mosfet 1500v MTBF UCL 2003 INCOMING RAW MATERIAL INSPECTION method
Text: QUALITY ASSURANCE and RELIABILITY PROGRAM 1. Introduction Samsung utilizes rigorous qualification and reliability programs to m onitor the integrity o f its devices. All industry standard and various non-standard stresses are run. Testing is done not only to collect data, but also to detect
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6V88
Abstract: No abstract text available
Text: lattice G A L 1 6 V 8 B /8 8 3 G A L I 6 V 8 A /8 8 3 High Performance E^MOS PLD FUNCTIONAL BLOCK DIAGRAM FEATURES • HIGH PERFORMANCE E>CMOS* TECHNOLOGY — 10 ns Maximum Propagation Delay — Fmax = 62.5 MHz — 7 ns Maximum from Clock Input to Data Output
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GAL16V8B)
100ms)
16V8A-20LR/883
962-89839022A
20-Pin
6V8A-25QD/883
5962-8983905RA
GAL16V8A-25QR/883
962-89839052A
6V88
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INCOMING RAW MATERIAL INSPECTION form
Abstract: IC 34992 ucl 11
Text: QUALITY ASSURANCE and RELIABILITY PROGRAM 1. Introduction Samsung utilizes rigorous qualification and reliability programs to monitor the integrity of its devices. All industry' standard and various non-standard stresses are run. Testing is done not only to collect data, but also to detect
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Untitled
Abstract: No abstract text available
Text: L i r t LT1126M/883 LT1127M/883 o TECHNOLOGY D u a l/Q u ad D eco m p ensated Low Noise, High Speed Precision O p Amps mnximum RATinos DCSCMPTIOn abso lute The LT1126M/883 dual and LT1127M/883 quad are high performance, decompensated op amps that offer higher
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126M/883
127M/883
LT1126M/883
LT1127M/883
LT1124
LT1125
LT1124/LT1125.
LT1126M/883andLT1127M/883are
MIL-STD-883
0D1143E
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