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    NEC Electronics Group UPD75008GBF22

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    ka 75000

    Abstract: No abstract text available
    Text: CHAPTER 1 GENERAL This chapter outlines the EP-75008GB-R. 1.1 Operating Environment The EP-75008GB-R is a probe set to connect the IE-75001-R and target system. By using the EP-75008GBR, the debugging environment for the /75008GB subseries is created, in which total debugging of the target


    OCR Scan     		EP-75008GB-R. EP-75008GB-R IE-75001-R EP-75008GBR, /iPD75008GB PD75008GB IE-75001-R IE-75000-R-EM EP-75008GB-R ka 75000 PDF

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    Abstract: No abstract text available
    Text: DATA SHEET NEC MOS INTEGRATED CIRCUIT 4-BIT SINGLE-CHIP MICROCONTROLLER DESCRIPTION The ¿¡PD75P0116 replaces the ,uPD750108’s internal mask ROM with a one-time PROM and features expanded ROM capacity. Because the ¿¡PD75P0116 supports programming by users, it is suitable for use in prototype testing for system


    OCR Scan     		PD75P0116 uPD750108 PD750104, PD750108 U11330E PD750108 PDF