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    Untitled

    Abstract: No abstract text available
    Text: Reliability Test Result DEVICE : BD9160FVM RESULT n pn pcs (pcs) - 22 100℃(5min) / 0℃ (5min) 10cycles 22 Tstg min (30min) / Tstg max (30min) 100cycles 22 Steady State Operating Life Test Apply the specified voltage at Topr max 1000hours 22 High Temperature Storage


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    PDF BD9160FVM 10cycles 30min) 100cycles 1000hours

    Untitled

    Abstract: No abstract text available
    Text: Reliability Test Result DEVICE : BU99901GUZ RESULT n pn pcs (pcs) - 22 100℃(5min) / 0℃ (5min) 10cycles 22 Tstg min (30min) / Tstg max (30min) 100cycles 22 Steady State Operating Life Test Apply the specified voltage at Topr max 1000hours 22 High Temperature Storage


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    PDF BU99901GUZ 10cycles 30min) 100cycles 1000hours

    Untitled

    Abstract: No abstract text available
    Text: Reliability Test Result DEVICE : BU9833GUL RESULT n pn pcs (pcs) - 22 100℃(5min) / 0℃ (5min) 10cycles 22 Tstg min (30min) / Tstg max (30min) 100cycles 22 Steady State Operating Life Test Apply the specified voltage at Topr max 1000hours 22 High Temperature Storage


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    PDF BU9833GUL 10cycles 30min) 100cycles 1000hours

    Untitled

    Abstract: No abstract text available
    Text: Reliability Test Result DEVICE : BU9829GUL RESULT n pn pcs (pcs) - 22 100℃(5min) / 0℃ (5min) 10cycles 22 Tstg min (30min) / Tstg max (30min) 100cycles 22 Steady State Operating Life Test Apply the specified voltage at Topr max 1000hours 22 High Temperature Storage


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    PDF BU9829GUL 10cycles 30min) 100cycles 1000hours

    bu9844

    Abstract: No abstract text available
    Text: Reliability Test Result DEVICE : BU9844GUL RESULT n pn pcs (pcs) - 22 100℃(5min) / 0℃ (5min) 10cycles 22 Tstg min (30min) / Tstg max (30min) 100cycles 22 Steady State Operating Life Test Apply the specified voltage at Topr max 1000hours 22 High Temperature Storage


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    PDF BU9844GUL 10cycles 30min) 100cycles 1000hours bu9844

    Untitled

    Abstract: No abstract text available
    Text: Reliability Test Result DEVICE : BU9889GUL RESULT n pn pcs (pcs) - 22 100℃(5min) / 0℃ (5min) 10cycles 22 Tstg min (30min) / Tstg max (30min) 100cycles 22 Steady State Operating Life Test Apply the specified voltage at Topr max 1000hours 22 High Temperature Storage


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    PDF BU9889GUL 10cycles 30min) 100cycles 1000hours

    BU9880GUL

    Abstract: No abstract text available
    Text: Reliability Test Result DEVICE : BU9880GUL RESULT n pn pcs (pcs) - 22 100℃(5min) / 0℃ (5min) 10cycles 22 Tstg min (30min) / Tstg max (30min) 100cycles 22 Steady State Operating Life Test Apply the specified voltage at Topr max 1000hours 22 High Temperature Storage


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    PDF BU9880GUL 10cycles 30min) 100cycles 1000hours BU9880GUL

    Untitled

    Abstract: No abstract text available
    Text: Reliability Test Result DEVICE : BR25S128GUZ RESULT n pn pcs (pcs) - 22 100℃(5min) / 0℃ (5min) 10cycles 22 Tstg min (30min) / Tstg max (30min) 100cycles 22 Steady State Operating Life Test Apply the specified voltage at Topr max 1000hours 22 High Temperature Storage


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    PDF BR25S128GUZ 10cycles 30min) 100cycles 1000hours

    Untitled

    Abstract: No abstract text available
    Text: Reliability Test Result DEVICE : BU9847GUL RESULT n pn pcs (pcs) - 22 100℃(5min) / 0℃ (5min) 10cycles 22 Tstg min (30min) / Tstg max (30min) 100cycles 22 Steady State Operating Life Test Apply the specified voltage at Topr max 1000hours 22 High Temperature Storage


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    PDF BU9847GUL 10cycles 30min) 100cycles 1000hours

    Untitled

    Abstract: No abstract text available
    Text: Reliability Test Result DEVICE : BU9832GUL RESULT n pn pcs (pcs) - 22 100℃(5min) / 0℃ (5min) 10cycles 22 Tstg min (30min) / Tstg max (30min) 100cycles 22 Steady State Operating Life Test Apply the specified voltage at Topr max 1000hours 22 High Temperature Storage


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    PDF BU9832GUL 10cycles 30min) 100cycles 1000hours

    BU9890GUL

    Abstract: No abstract text available
    Text: Reliability Test Result DEVICE : BU9890GUL RESULT n pn pcs (pcs) - 22 100℃(5min) / 0℃ (5min) 10cycles 22 Tstg min (30min) / Tstg max (30min) 100cycles 22 Steady State Operating Life Test Apply the specified voltage at Topr max 1000hours 22 High Temperature Storage


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    PDF BU9890GUL 10cycles 30min) 100cycles 1000hours BU9890GUL

    Untitled

    Abstract: No abstract text available
    Text: 8 Bit Microcontroller TLCS-870/C Series TMP86FH93NG The information contained herein is subject to change without notice. 021023_D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity


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    PDF TLCS-870/C TMP86FH93NG

    hf 224 capacitor

    Abstract: No abstract text available
    Text: 8 Bit Microcontroller TLCS-870/C Series TMP86C407MG TMP86C407MG The information contained herein is subject to change without notice. 021023 _ D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and


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    PDF TLCS-870/C TMP86C407MG hf 224 capacitor

    hf 224 capacitor

    Abstract: No abstract text available
    Text: 8 Bit Microcontroller TLCS-870/C Series TMP86C808DMG TMP86C808DMG The information contained herein is subject to change without notice. 021023 _ D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and


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    PDF TLCS-870/C TMP86C808DMG hf 224 capacitor

    TMP86CM74AFG

    Abstract: No abstract text available
    Text: 8 Bit Microcontroller TLCS-870/C Series TMP86CM74AFG The information contained herein is subject to change without notice. 021023_D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and


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    PDF TLCS-870/C TMP86CM74AFG TMP86CM74AFG

    Untitled

    Abstract: No abstract text available
    Text: 8 Bit Microcontroller TLCS-870/C1 Series TMP89FH46 The information contained herein is subject to change without notice. 021023_D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and


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    PDF TLCS-870/C1 TMP89FH46

    automatic light dimmer based on temperature

    Abstract: No abstract text available
    Text: 8 Bit Microcontroller TLCS-870/C Series TMP86CK74AFG The information contained herein is subject to change without notice. 021023_D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and


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    PDF TLCS-870/C TMP86CK74AFG automatic light dimmer based on temperature

    Untitled

    Abstract: No abstract text available
    Text: 8 Bit Microcontroller TLCS-870/C1 Series TMP89FM46L The information contained herein is subject to change without notice. 021023_D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity


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    PDF TLCS-870/C1 TMP89FM46L

    Untitled

    Abstract: No abstract text available
    Text: 8 Bit Microcontroller TLCS-870/C1 Series TMP89CM42 The information contained herein is subject to change without notice. 021023_D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity


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    PDF TLCS-870/C1 TMP89CM42

    tmp86fs49aug

    Abstract: No abstract text available
    Text: 8 Bit Microcontroller TLCS-870/C Series TMP86FS49AUG TMP86FS49AUG The information contained herein is subject to change without notice. 021023 _ D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and


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    PDF TLCS-870/C TMP86FS49AUG tmp86fs49aug

    Untitled

    Abstract: No abstract text available
    Text: 8 Bit Microcontroller TLCS-870/C Series TMP86FH47ADUG TMP86FH47ADUG The information contained herein is subject to change without notice. 021023 _ D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and


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    PDF TLCS-870/C TMP86FH47ADUG

    Untitled

    Abstract: No abstract text available
    Text: 8 Bit Microcontroller TLCS-870/C1 Series TMP89FH42L The information contained herein is subject to change without notice. 021023_D TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity


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    PDF TLCS-870/C1 TMP89FH42L

    Untitled

    Abstract: No abstract text available
    Text: 8 Bit Microcontroller TLCS-870/C1 Series TMP89FM42L 2009 TOSHIBA CORPORATION All Rights Reserved Revision History Date Revision 2008/2/14 1 First Release 2008/9/3 2 Contents Revised 2009/7/21 3 Contents Revised Table of Contents TMP89FM42L 1.1 1.2 1.3 1.4


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    PDF TLCS-870/C1 TMP89FM42L

    w1p84

    Abstract: No abstract text available
    Text: 8 Bit Microcontroller TLCS-870/C1 Series TMP89FM82 2009 TOSHIBA CORPORATION All Rights Reserved TMP89FM82 Considerations for using Motor Control Circuit PMD:Programmable Motor Driver Following considerations are necessary for writing data to electrical lead angle timer (ELDEG) and reading 2 bytes


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    PDF TLCS-870/C1 TMP89FM82 0x017F 0x0000 w1p84