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sharp CCD Camera Abstract: Transformer Inspection Testing C2955 C7103 control using ic 741 die bonding CCD in a TV camera Text: TENTATIVE DATA SHEET INFRARED IC INTERNAL INSPECTION SYSTEM C2955 From the backside of the chip, you can see through the silicon substrate to the patterns of the chip by means of an infrared light. A newly developed infrared CCD camera is used to inspect pattern	Original	PDF	C2955 C2955 SE-171-41 1025E02 JUL/99 sharp CCD Camera Transformer Inspection Testing C7103 control using ic 741 die bonding CCD in a TV camera

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sharp CCD Camera

Abstract: Transformer Inspection Testing C2955 C7103 control using ic 741 die bonding CCD in a TV camera
Text: TENTATIVE DATA SHEET INFRARED IC INTERNAL INSPECTION SYSTEM C2955 From the backside of the chip, you can see through the silicon substrate to the patterns of the chip by means of an infrared light. A newly developed infrared CCD camera is used to inspect pattern

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C2955 C2955 SE-171-41 1025E02 JUL/99 sharp CCD Camera Transformer Inspection Testing C7103 control using ic 741 die bonding CCD in a TV camera