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    Untitled

    Abstract: No abstract text available
    Text: 37E D • HARRIS 4302271 0G2h01b SEfllCOND SECTOR 7 IH AS High-Reliability High-Speed CMOS Logic ICs CD54HC4046A/3A CD54HCT4046A/3A Phase-Locked Loop with VCO h ^ stm -7 Th e R C A C D 54H C 4046A and C D 5 4 H C T 4 0 4 6A are high­ speed Si-gate C M O S devices that are pin com patible with


    OCR Scan     		PDF 0G2h01b CD54HC4046A/3A CD54HCT4046A/3A 4046B 4000B

    Untitled

    Abstract: No abstract text available
    Text: 37E D Hlgh-Reliability High-Speed CMOS Logic IC s * Dynam ic . • "P 4 S Z 3 - 7 Burn-In Test-Circuit Connections CD54HC/HCT4020 M3G2S71 0G2bG13 1 ■ HAS HARRIS SEMICOND SECTOR CD54HC4020/3A CD54HCT4020/3A Static ■ - (Use S tatic II fo r /3A burn-in and D ynam ic fo r Life Test.


    OCR Scan     		PDF CD54HC/HCT4020 M3G2S71 0G2bG13 CD54HC4020/3A CD54HCT4020/3A 2k-47k CD54HC4024/3A CD54HCT4024/3A