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    "RADHARD" OVERVIEW Search Results

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    Catalog Datasheet MFG & Type Document Tags PDF

    Untitled

    Abstract: No abstract text available
    Text: Standard Products PWM5031 / PWM5032 RadHard High Speed PWM Controller www.aeroflex.com/RadHard November 3, 2008 FEATURES ❑ Radiation hardness: - Total dose 1MRad Si - Single event latchup (SEL) immune to 100MeV-cm2 /mg - Single event upset (SEU) 20MeV-cm2 /mg


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    PWM5031 PWM5032 100MeV-cm2 20MeV-cm2 SCD5031 PDF

    5962-0625102KXA

    Abstract: PWM5032-EM2 5962-0625102KYC PWM5034
    Text: Standard Products PWM5031 / PWM5032 RadHard High Speed PWM Controller www.aeroflex.com/RadHard April 4, 2008 FEATURES ❑ Radiation hardness: - Total dose 1MRad Si - Single event upset (SEU) 100MeV-cm2 /mg ❑ CMOS low power design Sleep & enable control lines


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    PWM5031 PWM5032 100MeV-cm2 PWM5034 PMW5032 SCD5031 5962-0625102KXA PWM5032-EM2 5962-0625102KYC PDF

    actel PLL schematic

    Abstract: 624 CCGA hardness tester radhard overview HX2000 RH1020 RH1280 XC8100 624-CCGA 256-CQFP
    Text: Semicustom Products FPGA to ASIC Conversions Fact Sheet July 2010 OVERVIEW Aeroflex Colorado Springs has over 20 years experience in converting FPGA and 3rd-party ASIC netlists into Aeroflex RadHard and non-RadHard ASICs. We maintain a growing database of FPGA and 3rd-party ASIC cell libraries used for conversion, and


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    RH1020, RH1280, RT54SX32S/72S, RTAX250S/1000S/2000S XC2/3/4000, XC8100, EMP5/7000 HR2/3000, HX2000 actel PLL schematic 624 CCGA hardness tester radhard overview HX2000 RH1020 RH1280 XC8100 624-CCGA 256-CQFP PDF

    Untitled

    Abstract: No abstract text available
    Text: Standard Products PWM5031 / PWM5032 RadHard High Speed PWM Controller www.aeroflex.com/RadHard October 23, 2006 FEATURES ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ Radiation hardness: - Total dose 1MRad Si - Single event upset (SEU) 100MeV-cm2 /mg


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    PWM5031 PWM5032 100MeV-cm2 24-Gull SCD5031 PDF

    folded cascode second stage

    Abstract: No abstract text available
    Text: Standard Products PWM5031 / PWM5032 RadHard High Speed PWM Controller www.aeroflex.com/RadHard March 30, 2006 FEATURES ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ Radiation hardness: - Total dose 1MRad Si - Single event upset (SEU) 100MeV-cm2 /mg


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    PWM5031 PWM5032 100MeV-cm2 24-Gull SCD5031 folded cascode second stage PDF

    25A45

    Abstract: UC1843x
    Text: Standard Products ACT5031 RadHard High Speed PWM Controller www.aeroflex.com/RadHard March 21, 2005 FEATURES ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ a n i y r Radiation Hardness: - Total Dose 100 KRad Si - Single Event Upset 80MeV-cm2 /mg


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    ACT5031 80MeV-cm2 24-lead, SCD5031 25A45 UC1843x PDF

    Untitled

    Abstract: No abstract text available
    Text: Standard Products PWM5031 / PWM5032 RadHard High Speed PWM Controller www.aeroflex.com/RadHard February 8, 2007 FEATURES ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ Radiation hardness: - Total dose 1MRad Si - Single event upset (SEU) 100MeV-cm2 /mg


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    PWM5031 PWM5032 100MeV-cm2 24-Gull SCD5031 PDF

    AN5031

    Abstract: No abstract text available
    Text: Standard Products PWM5031 / PWM5032 RadHard High Speed PWM Controller www.aeroflex.com/RadHard November 2, 2007 FEATURES ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ Radiation hardness: - Total dose 1MRad Si - Single event upset (SEU) 100MeV-cm2 /mg


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    PWM5031 PWM5032 100MeV-cm2 24-Gull SCD5031 AN5031 PDF

    PWM5031

    Abstract: ACT5031
    Text: Standard Products PWM5031 RadHard High Speed PWM Controller www.aeroflex.com/RadHard November 30, 2005 y r a n i il m e r P FEATURES ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ Radiation hardness: - Total dose 1MRad Si - Single event upset (SEU) 100MeV-cm2 /mg


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    PWM5031 100MeV-cm2 appl585 SCD5031 ACT5031 PDF

    UT7R995

    Abstract: quartz 100MHZ UT7R9951 MN54AC25C85
    Text: UT7R995 RadClockTM RadHard Clock Generation and Distribution UT7R995 Products TM Executive Product Overview RadClock Date: February 2005 The Clock Problem Serious Challenges to Timing Margin Part-to-Part Skew & Jitter Problems Current Clock Network Solution


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    UT7R995 UT23RH16 UT23RH12 UT89535 UT7R9951 12mA/24mA quartz 100MHZ MN54AC25C85 PDF

    mil-std-1553b SPECIFICATION

    Abstract: honeywell dcs manual smd code A1t MIL-STD-1773 A1t smd TSI S 14001 1553 SUmmit me 555 AS1773 UT69151
    Text: S f.lMMIT TM Reference Manual Aeroflex Colorado Springs 4350 Centennial Blvd. Colorado Springs, CO 80907 719-594-8000, 719-594-8468 fax www.aeroflex.com/radhard SJ.1MMITTMReference Manual Table of Contents Overview Presentation Section 1 Engineering Notebooks


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    MC68HC11 UT69151 80C51 31-0-01-D1 31-o-o1-aJ mil-std-1553b SPECIFICATION honeywell dcs manual smd code A1t MIL-STD-1773 A1t smd TSI S 14001 1553 SUmmit me 555 AS1773 PDF

    vcsel spice model

    Abstract: magnetic stripe data conversion ir sensor interface with 8051 laser diode spice modeling micron fuse resistors "x-ray detector" VCSEL photodiode L035 interfacing 8051 with magnetic stripe readers metal detector plans
    Text: RadHard Mixed-Signal Overview Aeroflex Colorado Springs April 2007 www.aeroflex.com/RadHardASIC Mixed-Signal Product Line T What we do…. – We connect real world, analog signals to digital systems – We provide the critical link between sensors and information systems


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    MSI Logic

    Abstract: Structure of D flip-flop UNITED TECHNOLOGIES MICROELECTRONICS CENTER "radhard" overview Upset
    Text: Single Event Upset Design Techniques for UTMC’s RadHard MSI Logic Family Overview A Single Event Upset SEU is the result of an ion transitioning through a semiconductor structure and depositing charge on a critical circuit node within that structure. In a CMOS logic circuit,


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    PWM5032

    Abstract: No abstract text available
    Text: Standard Products Datasheet PWM5032 RadHard High Speed PWM Controller Radiation Tolerant www.aeroflex.com/PWM March 27, 2015 FEATURES  Radiation performance - Total dose > 1 Mrad Si , Dose rate = 50 - 300 rads(Si)/s - SEL: Immune to 100 MeV-cm2/mg - SEU:


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    PWM5032 SCD5031 PDF

    Untitled

    Abstract: No abstract text available
    Text: Semicustom Products UT90nSDTC-EVB, 3.125 Gbps Quad-lane SerDes Macro Evaluation Board Data Sheet February 2014 www.aeroflex.com/RadHardASIC FEATURES  Aeroflex UT90nHBD 3.125 Gbps SerDes Macro transceiver, CMOS9SF RadHard-by-Design  SMA interfaced Quad Full-Duplex High-Speed Serial


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    UT90nSDTC-EVB, UT90nHBD PDF

    "radhard" overview

    Abstract: No abstract text available
    Text: Semicustom Products Customer Owned Tooling Services COTS Fact Sheet October 2007 www.aeroflex.com/RadHard Overview: Aeroflex Colorado Springs’s Customer Owned Tooling Services (COTS) design flow allows the designer to take advantage of an ASIC process that can optimize performance, power, die size, and functionality. By using COTS, designers need only one vendor


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    simple on/off temperature control circuits

    Abstract: CT2100-400
    Text: Standard Products CT2100-400 Microprocessor Controlled QUAD Solid State Relay www.aeroflex.com/RadHard October 16, 2006 FEATURES ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ 4 Independent 1.0 amp switches 600 Volts isolation between switches Operates from a 5 Volt logic and 15 Volt bias


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    CT2100-400 MIL-STD-883 40-pins, SCDCT2100 simple on/off temperature control circuits PDF

    NIN18

    Abstract: No abstract text available
    Text: Standard Products PWM5032 RadHard High Speed PWM Controller Radiation Tolerant www.aeroflex.com/PWM March 26, 2012 FEATURES ❑ Radiation performance - Total dose > 1 Mrad Si , Dose rate = 50 - 300 rads(Si)/s - SEL: Immune to 100 MeV-cm2/mg - SEU: Immune up to 20 MeV-cm2/mg


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    PWM5032 SCD5031 NIN18 PDF

    PMW5032

    Abstract: PWM5031 PWM5032 PWM5032-EVAL
    Text: Standard Products PWM5031 / PWM5032 RadHard High Speed PWM Controller Radiation Tolerant www.aeroflex.com/PWM June 9, 2009 FEATURES ❑ Radiation performance - Total dose 1 Mrad Si , Dose rate = 50 - 300 rads(Si)/s - SEL: Immune to 100 MeV-cm2/mg - SEU: Immune up to 20 MeV-cm2/mg


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    PWM5031 PWM5032 er-4585 SCD5031 PMW5032 PWM5032-EVAL PDF

    PWM5032

    Abstract: PWM5032-001-2S PWM5032-S PWM5032-001-1S pmw5032 16PF PWM5031
    Text: Standard Products PWM5032 RadHard High Speed PWM Controller Radiation Tolerant www.aeroflex.com/PWM April 22, 2010 FEATURES ❑ Radiation performance - Total dose 1 Mrad Si , Dose rate = 50 - 300 rads(Si)/s - SEL: Immune to 100 MeV-cm2/mg - SEU: Immune up to 20 MeV-cm2/mg


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    PWM5032 SCD5031 PWM5032-001-2S PWM5032-S PWM5032-001-1S pmw5032 16PF PWM5031 PDF

    PWM5032

    Abstract: No abstract text available
    Text: Standard Products PWM5032 RadHard High Speed PWM Controller Radiation Tolerant www.aeroflex.com/PWM March 26, 2012 FEATURES ❑ Radiation performance - Total dose > 1 Mrad Si , Dose rate = 50 - 300 rads(Si)/s - SEL: Immune to 100 MeV-cm2/mg - SEU: Immune up to 20 MeV-cm2/mg


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    PWM5032 err-4585 SCD5031 PDF

    UC1843x

    Abstract: transistor 2N2222 SMD configuration 25A45 PWM5031 PWM5031-7 5v to 20v pwm amplifier 40khz folded cascode current mirror op amp
    Text: Standard Products PWM5031 RadHard High Speed PWM Controller www.aeroflex.com/Power August 2, 2005 y r a n i il m e r P FEATURES ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ ❑ Radiation Hardness: - Total Dose 1MRad Si - Single Event Upset (SEU) 100MeV-cm2 /mg


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    PWM5031 100MeV-cm2 SCD5031 UC1843x transistor 2N2222 SMD configuration 25A45 PWM5031-7 5v to 20v pwm amplifier 40khz folded cascode current mirror op amp PDF

    UT8ER512K32

    Abstract: RAMDE scrub SRAM edac UT8ER512K32S
    Text: Aeroflex Colorado Springs Application Note Designing with the UT8ER512K32 Monolithic 16M RadHardTM SRAM 1. Introduction This application note describes how to use the UT8ER512K32 Monolithic 16M RadHard SRAM in different system configurations, including a detailed look at the bus signals and CPU interface. The reader will also gain an understanding of how error detection and correction EDAC functions and improves error rate.


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    UT8ER512K32 70000h 7FF00h 3A500h 55A00h 10500h 000XXh RAMDE scrub SRAM edac UT8ER512K32S PDF

    Structure of D flip-flop

    Abstract: No abstract text available
    Text: Single Event Upset Design Techniques for UTMC’s Rad-Hard MSI Logic Family Overview A Single Event Upset SEU is the result of an ion transitioning through a semiconductor struc­ ture and depositing charge on a critical circuit node within that structure. In a CMOS logic circuit,


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